The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Aug. 04, 2015
Applicant:

Xerox Corporation, Norwalk, CT (US);

Inventors:

Patricia J. Donaldson, Pittsford, NY (US);

William H. Wayman, Ontario, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J 29/393 (2006.01); B41J 2/045 (2006.01); B41J 2/21 (2006.01); B29C 67/00 (2006.01); B41J 2/125 (2006.01); B41J 2/14 (2006.01); B33Y 50/02 (2015.01); B33Y 30/00 (2015.01);
U.S. Cl.
CPC ...
B41J 29/393 (2013.01); B29C 67/0059 (2013.01); B29C 67/0088 (2013.01); B33Y 50/02 (2014.12); B41J 2/04535 (2013.01); B41J 2/04585 (2013.01); B41J 2/125 (2013.01); B41J 2/14153 (2013.01); B41J 2/21 (2013.01); B41J 2/2107 (2013.01); B41J 2/2142 (2013.01); B33Y 30/00 (2014.12); B41J 2029/3935 (2013.01);
Abstract

An apparatus detects inoperative inkjets during printing. The apparatus operates the printhead or printheads in the printer to form test pattern on a thermal substrate. The heat of the materials used to form the test pattern change the optical density of the areas where the materials land. The area where the test pattern is formed is imaged and the image data are analyzed to identify inoperative inkjets.


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