The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Dec. 20, 2010
Applicants:

Gerhard Hammann, Korntal-Muenchingen, DE;

Ulrich Ritter, Aystetten, DE;

Dirk Fey, Neewiller, FR;

Giovanni Sanfelici, Karlsruhe, DE;

Gunther Krieg, Karlsruhe, DE;

Inventors:

Gerhard Hammann, Korntal-Muenchingen, DE;

Ulrich Ritter, Aystetten, DE;

Dirk Fey, Neewiller, FR;

Giovanni Sanfelici, Karlsruhe, DE;

Gunther Krieg, Karlsruhe, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23K 26/02 (2014.01); B23K 26/03 (2006.01); B23K 26/08 (2014.01); B23K 26/12 (2014.01); B23K 26/38 (2014.01); G01N 21/17 (2006.01); G01N 29/14 (2006.01); G01N 29/46 (2006.01);
U.S. Cl.
CPC ...
B23K 26/03 (2013.01); B23K 26/0884 (2013.01); B23K 26/12 (2013.01); B23K 26/128 (2013.01); B23K 26/38 (2013.01); G01N 21/1702 (2013.01); G01N 29/14 (2013.01); G01N 29/46 (2013.01); B23K 2201/18 (2013.01);
Abstract

A laser processing machine for processing workpieces includes a beam guide containing a gas atmosphere, and also includes an apparatus for investigating the gas atmosphere in the beam guide for impurities. The investigation apparatus makes use of the photoacoustic effect. The measuring apparatus has a measuring chamber and at least one measuring head, where the beam guide acts as the measuring chamber. As a measuring chamber, the beam guide contains the gas atmosphere that is to be investigated and also a modulated laser beam modulated. The measuring head(s) are integrated into the beam guide and are used to detect the photoacoustic effect in the measuring chamber.


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