The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
May. 11, 2012
Damien Prieels, Court-Saint-Etienne, BE;
Alexandre Debatty, Hevillers, BE;
Damien Prieels, Court-Saint-Etienne, BE;
Alexandre Debatty, Hevillers, BE;
Ion Beam Applications S.A., Louvain-la-Neuve, BE;
Abstract
The invention is related to a method and apparatus for verifying the beam range in a target irradiated with a charged hadron beam, such as a proton beam. The beam range is the location of the Bragg peak in the target, being the location where the largest portion of the dose is delivered. The method utilizes a prompt gamma camera provided with a slit-shaped opening, so as to be able to produced a 1-dimensional profile of the dose distribution along the beam line. The camera is mounted with the slit oriented perpendicularly to the beam line. The method comprises the steps of calculating a position of the camera with respect to a target, for a plurality of beam energies and spots to be irradiated. The method further comprises the steps of verifying the beam range for said plurality of spots, and delivering a value representative of the difference between the estimated beam range and the actual beam range. The apparatus of the invention is provided with a positioning module for positioning the camera.