The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 07, 2016

Filed:

Mar. 02, 2011
Applicants:

Akira Uematsu, Suwa, JP;

Noriyuki Nakamura, Sakata, JP;

Akira Komatsu, Kamiina-gun, JP;

Kunihiko Yano, Shiogiri, JP;

Inventors:

Akira Uematsu, Suwa, JP;

Noriyuki Nakamura, Sakata, JP;

Akira Komatsu, Kamiina-gun, JP;

Kunihiko Yano, Shiogiri, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2014.01); A61B 5/1455 (2006.01); H01L 31/0216 (2014.01); H01L 31/103 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14552 (2013.01); H01L 31/02162 (2013.01); H01L 31/02325 (2013.01); H01L 31/103 (2013.01);
Abstract

A spectroscopic sensor has plural angle limiting filters that limit incident angles of incident lights, plural light band-pass filters that transmit specific wavelengths, and plural photodiodes to which corresponding transmitted lights are input. The spectroscopic sensor is a semiconductor device in which the angle limiting filters, the light band-pass filters, and the photodiodes are integrated, and, assuming that the surface on which impurity regions for the photodiodes are formed is a front surface of a semiconductor substrate, holes for receiving lights are formed in the impurity regions from the rear surface side.


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