The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 07, 2016
Filed:
Sep. 09, 2013
Applicant:
Yan Zhang, Vernon, CT (US);
Inventor:
Yan Zhang, Vernon, CT (US);
Assignee:
Other;
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/10 (2006.01); A61B 3/02 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/0025 (2013.01); A61B 3/1241 (2013.01); A61B 3/145 (2013.01);
Abstract
The present invention relates generally to apparatus and methods for evaluating the condition and properties of eye tissue. More particularly, the present invention is directed to apparatus and methods for non-invasively characterizing the biomechanical properties of eye tissue by utilizing an internal perturbation component.