The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Apr. 25, 2012
Applicant:

Yonatan Tzafrir, Petah Tikva, IL;

Inventor:

Yonatan Tzafrir, Petah Tikva, IL;

Assignee:

SANDISK TECHNOLOGIES INC., Plano, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); H01L 23/34 (2006.01); G06F 11/00 (2006.01); G06F 11/30 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
H01L 23/34 (2013.01); G06F 11/004 (2013.01); G06F 11/3037 (2013.01); G06F 11/3058 (2013.01); G11C 16/3418 (2013.01); G06F 11/3089 (2013.01); G06F 2212/7208 (2013.01); H01L 2924/0002 (2013.01);
Abstract

A method includes, in a nonvolatile memory device that includes a plurality of dies, detecting that a first temperature associated with a first die is equal to or exceeds a temperature threshold. A metablock is defined to include a first plurality of storage blocks that includes a first storage block of the first die. Each storage block of the metablock resides in a distinct die of the plurality of dies. The method also includes, in response to detecting that the first temperature is equal to or exceeds the temperature threshold, redefining the metablock to exclude from the redefined metablock any storage block associated with the first die.


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