The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Dec. 04, 2014
Applicant:

Thermo Finnigan Llc, San Jose, CA (US);

Inventors:

Johnathan Wayne Smith, San Jose, CA (US);

Alan E. Schoen, San Jose, CA (US);

Assignee:

THERMO FINNIGAN LLC, San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 49/02 (2006.01); H01J 49/42 (2006.01);
U.S. Cl.
CPC ...
H01J 49/025 (2013.01); H01J 49/4215 (2013.01); H01J 2237/24435 (2013.01);
Abstract

An ion detection system for a detecting a quantity of ions exiting from a mass analyzer of a mass spectrometer comprises: (a) photon generating means configured to receive the quantity of ions and to generate a quantity of photons that is proportional to the quantity of ions; (b) a light collection lens optically coupled to the photon generating means and configured to transmit a beam of the generated photons; (c) line focusing means operable to focus at least a first portion of the beam to a line; and (d) a linear array of photo-detectors configured to detect a variation of the quantity of generated photons along the focused line.


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