The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Jan. 17, 2014
Applicant:
University of Hawaii, Honolulu, HI (US);
Inventors:
Assignee:
University of Hawaii, Honolulu, HI (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 16/26 (2006.01); G11C 16/34 (2006.01); H03M 13/41 (2006.01); H04L 1/00 (2006.01); H04L 25/06 (2006.01); H04L 25/03 (2006.01); H03M 13/39 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G11C 16/26 (2013.01); G11C 16/3427 (2013.01); H03M 13/3905 (2013.01); H03M 13/41 (2013.01); H04L 1/0054 (2013.01); H04L 1/0059 (2013.01); H04L 25/067 (2013.01); H04L 2025/03363 (2013.01);
Abstract
A method for determining decision metrics in a detector for a memory device. The method includes receiving a plurality of signal samples and extracting a set of statistics from the signal samples, wherein at least one of the statistics is non-linear or complex, is derived from a plurality of the signal samples, and is not a function of at least one real linear statistic that is derived from a plurality of the signal samples. The method also includes applying at least one decision metric function to the set of statistics to determine at least one decision metric value corresponding to at least one postulated symbol.