The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Mar. 05, 2014
International Business Machines Corporation, Armonk, NY (US);
Robert G. Biskeborn, Hollister, CA (US);
Gary M. Decad, Palo Alto, CA (US);
Calvin S. Lo, Saratoga, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Determining quality metrics of recorded data on a magnetic recording medium. Each of two or more read element arrays include one or more read elements, each including a sensor. Each array differs from the other arrays in one or more construction characteristics such that each array has a different sensitivity to one or more characteristics of magnetic transitions recorded on a magnetic recording medium. Each array produces respective electrical signals that are characteristic of magnetic transitions recorded on a magnetic recording medium. A computer receives information from the electrical signals and analyzes the signal information to determine one or more values associated with one or more quality metrics of the magnetic transitions.