The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

May. 27, 2014
Applicant:

Cavium, Inc., San Jose, CA (US);

Inventors:

Shahid Ikram, Shrewsbury, MA (US);

Isam Akkawi, Santa Clara, CA (US);

John Perveiler, Oxford, MA (US);

David Asher, Sutton, MA (US);

James Ellis, Hubbardston, MA (US);

Assignee:

CAVIUM, INC., San Jose, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G06F 11/273 (2006.01); G06F 15/78 (2006.01); G06F 11/267 (2006.01);
U.S. Cl.
CPC ...
G06F 17/5081 (2013.01); G06F 17/5045 (2013.01); G06F 11/267 (2013.01); G06F 11/2733 (2013.01); G06F 15/78 (2013.01);
Abstract

A new approach is proposed that contemplates a system and method to support automated functional coverage generation and management for an IC design protocol. The proposed approach takes advantage of table-based high-level (e.g., transaction-level) specifications of the IC design protocol, wherein the state tables are readable and easily manageable (e.g., in ASCII format) in order to automatically generate functional coverage for the IC design protocol, which include but are not limited to, coverage points, protocol transitions, and/or transaction coverage. The automatically generated functional coverage is then verified via formal verification and simulated at the register-transfer level (RTL) during the coverage generation and management process. The coverage data from the formal verification and the simulation runs are then analyzed and used to guide and revise the IC design protocol in a coverage-based closed-loop IC design process.


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