The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Apr. 24, 2014
Applicant:

Marvell International Ltd., Hamilton, BM;

Inventors:

Qinwei Gu, Shanghai, CN;

Yu Bai, Shrewsbury, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/00 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3062 (2013.01);
Abstract

Embodiments of the present invention provide a method that comprises, within a sample window, determining an active time of a central processing unit (CPU) at an operating frequency. If there are any different operating frequencies within the sample window, the method further comprises determining active times of the CPU at the different operating frequencies within the sample window and, based upon the active times for the operating frequencies within the sample window, calculating a millions of instructions per second (MIPS) value for the sample window. The method further comprises performing a comparison of the MIPS value to a threshold value and, based upon the comparison of the MIPS value to the threshold value, setting an operating frequency of the CPU for a next sample window.


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