The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Mar. 15, 2011
Byoung Ju Choi, Seoul, KR;
Joo Young Seo, Seoul, KR;
Sueng Wan Yang, Gyeonggi-do, KR;
Jin Yong Lim, Gyeonggi-do, KR;
Young Su Kim, Gyeonggi-do, KR;
Jung Suk OH, Gyeonggi-do, KR;
Hae Young Kwon, Gyeonggi-do, KR;
Seung Yeun Jang, Gyeonggi-do, KR;
Byoung Ju Choi, Seoul, KR;
Joo Young Seo, Seoul, KR;
Sueng Wan Yang, Gyeonggi-do, KR;
Jin Yong Lim, Gyeonggi-do, KR;
Young Su Kim, Gyeonggi-do, KR;
Jung Suk Oh, Gyeonggi-do, KR;
Hae Young Kwon, Gyeonggi-do, KR;
Seung Yeun Jang, Gyeonggi-do, KR;
Hyundai Motor Company, Seoul, KR;
Kia Motors Corporation, Seoul, KR;
Ehwa University Industry Collaboration Foundation, Seoul, KR;
Abstract
The present invention relates to a system test apparatus. The system test apparatus includes an insertion module configured to insert a test agent into a process control block, a hooking module configured to hook a test target to a test code using the test agent when an event related to the test target occurs, a scanning module configured to collect pieces of test information about a process in which the event related to the test target has occurred when the test target is hooked, and a logging module configured to store the pieces of test information collected by the scanning module.