The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

May. 23, 2014
Applicants:

Smk Corporation, Tokyo, JP;

Kabushiki Kaisha Tokai Rika Denki Seisakusho, Aichi, JP;

Inventors:

Osamu Yoshikawa, Tokyo, JP;

Takao Imai, Aichi, JP;

Syogo Yamaguchi, Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/045 (2006.01); G06F 3/041 (2006.01); G06F 3/044 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0418 (2013.01); G06F 3/044 (2013.01); G06F 2203/04101 (2013.01); G06F 2203/04112 (2013.01);
Abstract

A plurality of detection electrodes S(n) are allocated to any one of two or more detection electrode groups SG(k) so that the detection electrodes S(n) to be allocated to each of the detection electrode groups SG(k) are disposed at equal intervals and spaced apart from each other by at least one detection electrode S(n) in the direction of detection. In each of the two or more detection electrode groups SG(k), the detection electrodes S(n) allocated to the detection electrode group SG(k) are sequentially selected in the direction of detection so as to compare the detection voltage levels R(n) that each appear on a set of detection electrodes S(n) and S(n+1) that are adjacent to each other in the direction of detection.


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