The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Dec. 05, 2013
Applicant:

Olympus Corporation, Shibuya-ku, Tokyo, JP;

Inventor:

Masaharu Tomioka, Higashiyamato, JP;

Assignee:

OLYMPUS CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01);
Abstract

Provided is a protection device including a cover member that is disposed on a stage of a microscope main unit, which is provided with a shutter that can block the entry of laser light into an objective lens from a total-reflection illumination optical system, so as to cover a specimen, and that can be opened and closed; and an open/close sensor that detects open and closed states of the cover member and that outputs a drive signal that causes the shutter to block the laser light when the cover member is detected to be in the open state, wherein the cover member has an opening at, in the closed state, a position away from a track along an optical path of the laser light that has been focused by the total-reflection illumination optical system and that has passed through the specimen.


Find Patent Forward Citations

Tomioka, Masaharu. (2016). Protection device and microscope system (U.S. Patent No. 9354435). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9354435

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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