The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Feb. 15, 2013
Helmholtz Zentrum Muenchen Deutsches Forschungszentrum Fuer Gesundheit Und Umwelt (Gmbh), Neuherberg, DE;
Technische Universitaet Muenchen, Munich, DE;
Stefan Thalhammer, Munich, DE;
Markus Hofstetter, Neubiberg, DE;
John Howgate, Munich, DE;
Martin Stutzmann, Erding, DE;
Helmholtz Zentrum Muenchen Deutsches Forschungszentrum fuer Gesundheit und Umwelt (GmbH), Neuherberg, DE;
Technische Universitaet Muenchen, Munich, DE;
Abstract
A method for detecting radiation during the examination of a sample () comprises the steps of generating the radiation, more particularly X-ray radiation or proton radiation, by means of a source device (), passing the radiation through the sample (), and detecting the radiation by means of at least one photoelectric solid-state detector () containing a photoconduction section having a predetermined response threshold and a potential well section for taking up free charge carriers. The solid-state detector () is a GaN- or GaAs-based semiconductor detector and the potential well section contains a two-dimensional electron gas (DEG). A setting of the radiation is provided in such a way that the solid-state detector () is operated separately from the response threshold of the photoconduction section and in a sensitivity range of the potential well section. An examination device () is also described, said examination device being configured for an examination of a sample () using radiation, more particularly X-ray radiation or proton radiation.