The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Jun. 19, 2013
Applicant:
Cilag Gmbh International, Zug, CH;
Inventors:
James Iain Rodgers, Inverness, GB;
Lawrence Ritchie, Inverness, GB;
Anna Zvikhachevskaya, Inverness, GB;
Jonathan Nelson, Inverness, GB;
Carlos Morales, West Chester, PA (US);
Assignee:
Cilag GmbH International, Zug, CH;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/327 (2006.01);
U.S. Cl.
CPC ...
G01N 27/3272 (2013.01); G01N 27/3273 (2013.01);
Abstract
An analyte meter with a test strip port that detects an orientation of a test strip inserted therein. A control circuit of the test meter is configured to apply a first predetermined analyte measurement signal to a test strip electrode in response to detecting a first orientation of the test strip, and a second predetermined analyte measurement signal to the same, or a different, electrode in response to detecting a second orientation of the test strip.