The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Mar. 05, 2014
Applicant:

Smiths Detection Inc., Edgewood, MD (US);

Inventor:

Vincent Yuan-Hsiang Lee, Winchester, MA (US);

Assignee:

Smiths Detection Inc., Edgewood, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01N 21/65 (2006.01);
U.S. Cl.
CPC ...
G01N 21/65 (2013.01);
Abstract

Systems and methods for analyzing samples in containers are provided, where an emitter emits radiation at a first location on the container, with a portion of the radiation passing through the container and into the sample, some of the radiation is reflected within the container, a detector receives a transmission Raman signal including Raman radiation from multiple portions of the sample, and a comparator compares the transmission Raman signal with the radiation emitted by the emitter.


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