The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Aug. 23, 2012
Applicants:

Antero Yli-koski, Piikkio, FI;

Pauli Salmelainen, Masku, FI;

Jukka Valtonen, Lieto, FI;

Inventors:

Antero Yli-Koski, Piikkio, FI;

Pauli Salmelainen, Masku, FI;

Jukka Valtonen, Lieto, FI;

Assignee:

Labrox Oy, Turku, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/64 (2006.01); G01J 1/04 (2006.01);
U.S. Cl.
CPC ...
G01N 21/6445 (2013.01); G01J 1/0444 (2013.01); G01J 1/0488 (2013.01); G01J 1/0492 (2013.01); G01N 21/645 (2013.01); G01N 21/6408 (2013.01);
Abstract

An apparatus for optically measuring samples, including a radiation source configured to form an excitation beam in an excitation channel, a detector configured to detect an emission beam in an emission channel and a filter configured to be located, in an excitation position, in the excitation channel, and in an emission position, in the emission channel. The apparatus further includes a first filter storage comprising a first set of filter storage positions, a second filter storage comprising a second set of filter storage positions, and a filter transfer mechanism configured to move the filter between the excitation position, the emission position, the first set of filter storage positions and the second set of filter storage positions.


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