The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Jul. 31, 2012
Applicants:

Bernd Sartorius, Berlin, DE;

Helmut Roehle, Berlin, DE;

Inventors:

Bernd Sartorius, Berlin, DE;

Helmut Roehle, Berlin, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2014.01); G01N 21/55 (2014.01); G01N 21/3577 (2014.01); G01N 21/41 (2006.01); G01N 21/90 (2006.01); G01N 21/3586 (2014.01); G01N 21/3504 (2014.01);
U.S. Cl.
CPC ...
G01N 21/55 (2013.01); G01N 21/3504 (2013.01); G01N 21/3577 (2013.01); G01N 21/3586 (2013.01); G01N 21/4133 (2013.01); G01N 21/90 (2013.01); G01N 21/9027 (2013.01); G01N 2021/4153 (2013.01);
Abstract

The invention relates to a method for determining a liquid in a closed container using THz radiation, in which a first and a second measurement are carried out, wherein the THz radiation is emitted in the direction of the liquid for measuring properties of the liquid, and a portion of the THz radiation coming from the direction of the liquid is detected. In the proposed method, the closed container contains, in addition to the liquid, a gas, wherein a wall of the container is transmissive for THz radiation and wherein the detected portion of the THz radiation in the first measurement is reflected at a boundary surface between the wall and the gas or a pocket containing the gas, and the second measurement is reflected at a boundary surface between the wall and the liquid. The first measurement thus serves as a reference measurement for capturing disturbing losses in the THz beam path and for determining influences of the wall on a measurement result for the second measurement. The invention further relates to an arrangement suitable for carrying out this method.


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