The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Nov. 01, 2013
California Institute of Technology, Pasadena, CA (US);
Benjamin Judkewitz, Los Angeles, CA (US);
Ying Min Wang, Pasadena, CA (US);
Roarke Horstmeyer, San Marino, CA (US);
Changhuei Yang, Alhambra, CA (US);
California Institute of Technology, Pasadena, CA (US);
Abstract
A method and apparatus for irradiating a scattering medium with increased resolution. The method includes transmitting EM radiation from an Electromagnetic (EM) radiation source to a target inside a scattering medium, wherein the target encodes the EM radiation with a variance structure to form encoded EM radiation; measuring, in a detector, transmitted EM radiation comprising at least a portion of the encoded EM radiation transmitted through and exiting the scattering medium; decoding the transmitted EM radiation, comprising EM fields, in a computer, comprising selecting one or more of the EM fields having the variance structure; and irradiating the scattering medium with time reversed EM radiation from a spatial light modulator (SLM), the time reversed EM radiation generated from time reversing the EM fields having the variance structure, thereby forming a focus of the time reversed EM radiation in the scattering medium with the increased resolution.