The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Nov. 19, 2013
Applicant:

Shimadzu Corporation, Kyoto-shi, Kyoto, JP;

Inventor:

Masahide Gunji, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G01J 3/18 (2006.01); G01J 3/02 (2006.01); G01N 30/74 (2006.01); G01N 21/3577 (2014.01); G01N 21/85 (2006.01);
U.S. Cl.
CPC ...
G01J 3/2803 (2013.01); G01J 3/0262 (2013.01); G01J 3/18 (2013.01); G01N 30/74 (2013.01); G01J 2003/2813 (2013.01); G01N 21/3577 (2013.01); G01N 21/85 (2013.01);
Abstract

A spectrophotometer in which a normal plane to a diffraction grating is inclined with respect to an optical axis of an incident light passing through a slit, the normal plane to the diffraction grating passing through an intersection point between the optical axis of the incident light i and a grating surface of the diffraction grating. The diffraction grating and a photodiode array PDA are placed such that the photodiode array PDA is parallel to the normal plane to the diffraction grating and that a normal plane to the photodiode array PDA includes a line that is symmetrical to the optical axis of the incident light i about the normal plane to the diffraction grating.


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