The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Nov. 04, 2011
Applicants:

Majeed M. Hayat, Albuquerque, NM (US);

John P. David, Sheffield, GB;

Sanjay Krishna, Albuquerque, NM (US);

Luke F. Lester, Albuquerque, NM (US);

David A. Ramirez, Albuquerque, NM (US);

Payman Zarkesh-ha, Albuquerque, NM (US);

Inventors:

Majeed M. Hayat, Albuquerque, NM (US);

John P. David, Sheffield, GB;

Sanjay Krishna, Albuquerque, NM (US);

Luke F. Lester, Albuquerque, NM (US);

David A. Ramirez, Albuquerque, NM (US);

Payman Zarkesh-Ha, Albuquerque, NM (US);

Assignees:

STC.UNM, Albuquerque, NM (US);

The University of Sheffield, Sheffield, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/46 (2006.01);
U.S. Cl.
CPC ...
G01J 1/46 (2013.01);
Abstract

Apparatus, systems, and methods relate to use of a time-varying bias for application to an avalanche photodiode. Embodiments include systems and methods of determining an appropriate time-varying bias for application to an avalanche photodiode in linear mode. Avalanche photodiode having appropriate parameters may also be determined. Additional apparatus, systems, and methods are disclosed.


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