The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Mar. 04, 2014
General Electric Company, Schenectady, NY (US);
Thomas James Batzinger, Burnt Hills, NY (US);
Gareth William David Lewis, Greenville, SC (US);
Jonathan Matthew Lomas, Simpsonville, SC (US);
Christopher Edward Thompson, Greenville, SC (US);
Birol Turan, Kocaeli, TR;
General Electric Company, Schenectady, NY (US);
Abstract
The invention relates generally to the measurement and dimensional analysis of an object and, more particularly, to the correction of distortion in volumetric data of the object using dimensional data of the object. In one embodiment, the invention provides a method of analyzing an object, the method comprising: acquiring volumetric data of an object using an X-ray computed tomography (CT) imaging system; acquiring dimensional data of the object using a vision-based system; determining whether the volumetric data include a distortion; and in the case that the volumetric data are determined to include a distortion, correcting the distortion in the volumetric data using the dimensional data.