The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Mar. 21, 2014
Fujifilm Corporation, Tokyo, JP;
Naoko Yoshida, Ashigara-kami-gun, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A wrinkle detection method comprises the steps of obtaining face data of a subject; setting one or more analytical regions on the obtained face data; producing plural pieces of wrinkle component extracted data by extracting wrinkle components extending in one direction or in plural directions at different angles from each other in an angle range in which wrinkles tend to extend and which is set in advance for the set one or more analytical regions; producing plural pieces of wrinkle component emphasized data corresponding to the pieces of wrinkle component extracted data, respectively, by emphasizing the wrinkle components; producing composite data by combining the pieces of wrinkle component emphasized data; and detecting a wrinkle component having an intensity equal to or greater than a predetermined threshold value from the composite data as a wrinkle of the subject.