The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Aug. 04, 2014
Applicant:

Covidien Lp, Mansfield, MA (US);

Inventor:

Clark R. Baker, Jr., Castro Valley, CA (US);

Assignee:

COVIDIEN LP, Mansfield, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/1455 (2006.01); A61B 5/00 (2006.01); A61B 5/0205 (2006.01); A61B 5/024 (2006.01);
U.S. Cl.
CPC ...
A61B 5/14551 (2013.01); A61B 5/0205 (2013.01); A61B 5/02416 (2013.01); A61B 5/7207 (2013.01); A61B 5/7214 (2013.01);
Abstract

Methods and systems for determining a physiological parameter in the presence of correlated artifact are provided. One method includes receiving two waveforms corresponding to two different wavelengths of light from a patient. Each of the two waveforms includes a correlated artifact. The method also includes combining the two waveforms to form a plurality of weighted difference waveforms, wherein the plurality of weighted difference waveforms vary from one another by a value of a multiplier. The method further includes identifying one of the weighted difference waveforms from the plurality of weighted difference waveforms using a characteristic of one or more of the plurality of weighted difference waveforms and determining a characteristic of the correlated artifact based at least in part on the identified weighted difference waveform.


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