The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2016

Filed:

Mar. 12, 2010
Applicants:

Seemantini K. Nadkarni, Boston, MA (US);

Guillermo J. Tearney, Cambridge, MA (US);

Inventors:

Seemantini K. Nadkarni, Boston, MA (US);

Guillermo J. Tearney, Cambridge, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 5/00 (2006.01); A61B 5/02 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0059 (2013.01); A61B 5/0062 (2013.01); A61B 5/02007 (2013.01);
Abstract

Exemplary embodiments of apparatus and method for determining at least one material property of an anatomical structure can be provided. According to one exemplary embodiment, it is possible to apply at least one first coherent radiation to at least one portion of the anatomical structure, and receive at least one second coherent radiation from such portion(s). The first and second coherent radiations can be associated with one another. In addition, it is possible to determine the material property based on the second coherent radiation(s). Such determination can be performed without (i) any portion of an apparatus performing the procedure causing an induction of at least one mechanical deformation on or in the anatomical structure, and/or (ii) any mechanical deformation on or in the anatomical structure.


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