The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 31, 2016
Filed:
Sep. 14, 2012
Tobias Bühren, Magdala, DE;
Michael Trost, Stadtroda, DE;
Burkhard Wagner, Jena, DE;
Carl Zeiss Meditec AG, Jena, DE;
Abstract
A method for calculating the values of an intraocular lens to be implanted, wherein the results of numerous cataract operations are taken into account in the calculation for intraocular lenses to be implanted in the future. At least the corneal topography, the length of the eye and the depth of the anterior chamber are determined pre-operatively, the values of the IOL to be implanted are calculated by means of ray-tracing, and at least the corneal topography, the length of the eye, the depth of the anterior chamber and the objective, wavefront-based residual refraction are determined post-operatively. The measurement values determined pre-operatively and post-operatively are used to optimize the surgically-induced astigmatism and the post-operative anatomical lens position for calculating the values of IOLs to be implanted in the future.