The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Sep. 14, 2012
Applicants:

Min LI, San Diego, CA (US);

Chia-yuan Teng, San Diego, CA (US);

Gregory Allan Vansickle, Stouffville, CA;

Inventors:

Min Li, San Diego, CA (US);

Chia-Yuan Teng, San Diego, CA (US);

Gregory Allan VanSickle, Stouffville, CA;

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 7/01 (2006.01); H04N 11/20 (2006.01); H04N 1/40 (2006.01); H04N 9/64 (2006.01); H04N 19/59 (2014.01);
U.S. Cl.
CPC ...
H04N 1/40068 (2013.01); H04N 7/0102 (2013.01); H04N 9/64 (2013.01); H04N 19/59 (2014.11); H04N 11/20 (2013.01);
Abstract

Described are a system and method to determine the initial luma and chroma phase such that the resulting image after chroma upsampling and scaling has zero phase difference between the luma and chroma components. Particularly, the described method may include receiving a subsampled input image having luma and chroma values. The method may then perform a phase computation of the input image to determine scaling parameters such that phase differences between all color components of an output image are zero. The method may then include performing a combined upscaling and upsampling process on the input image using the scaling parameters to generate an upscaled image with no phase difference from the subsampled image.


Find Patent Forward Citations

Loading…