The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9349864 B1

PDF
Full Text
Expired
Date of Patent:
May. 24, 2016

Filed:

Aug. 14, 2015
Applicant:

Globalfoundries, Inc., Grand Cayman, KY;

Inventors:

Timothy James Mcardle, Hopewell Junction, NY (US);

Judson Robert Holt, Wappingers Falls, NY (US);

Churamani Gaire, Clifton Park, NY (US);

Assignee:

GLOBALFOUNDRIES, INC., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 29/78 (2006.01); H01L 29/66 (2006.01); H01L 21/225 (2006.01); H01L 21/324 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7848 (2013.01); H01L 21/0245 (2013.01); H01L 21/02516 (2013.01); H01L 21/02532 (2013.01); H01L 21/02609 (2013.01); H01L 21/2251 (2013.01); H01L 21/324 (2013.01); H01L 29/66636 (2013.01);
Abstract

Methods for fabricating integrated circuits including selectively forming layers of increased dopant concentration are provided. In an embodiment, a method for fabricating an integrated circuit includes forming a material layer with a selected facet on a selected plane and a non-selected facet on a non-selected plane. The method further includes performing an epitaxial deposition process with a dopant source to grow an in-situ doped epitaxial material on the material layer. The epitaxial deposition process grows the in-situ doped epitaxial material on the selected facet at a first growth rate and over the non-selected facet at a second growth rate greater than the first growth rate. A layer of increased dopant concentration is selectively formed over the selected facet.


Find Patent Forward Citations

Mcardle, Timothy. (2016). Methods for selectively forming a layer of increased dopant concentration (U.S. Patent No. 9349864). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9349864

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…