The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Dec. 09, 2014
Applicant:

SK Hynix Inc., Icheon-si Gyeonggi-do, KR;

Inventor:

Dong Yoon Ka, Icheon-si Gyeonggi-do, KR;

Assignee:

SK hynix Inc., Icheon-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/02 (2006.01); G11C 7/10 (2006.01); G11C 7/14 (2006.01);
U.S. Cl.
CPC ...
G11C 29/022 (2013.01); G11C 7/106 (2013.01); G11C 7/1006 (2013.01); G11C 7/14 (2013.01);
Abstract

A semiconductor memory apparatus includes an internal data generation block configured to generate test data in response to test signals, and output ones of normal data inputted from data input/output pads and the test data as internal data according to a test flag signal; a data storage region configured to receive and store the internal data, and output stored data as cell storage data; a latch block configured to receive and store the cell storage data in response to a data output enable signal, and output stored data as latch data; and a data comparison block configured to compare the test data and the latch data, and generate a test result signal.


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Quick Actions:

Ka, Dong. (2016). Semiconductor memory apparatus including an internal generation circuit configured to generate test data (U.S. Patent No. 9349486). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9349486

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