The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Nov. 08, 2011
Applicants:
Masaki Saitoh, Osaka, JP;
Naoki Makita, Osaka, JP;
Inventors:
Masaki Saitoh, Osaka, JP;
Naoki Makita, Osaka, JP;
Assignee:
SHARP KABUSHIKI KAISHA, Osaka, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); G09G 3/36 (2006.01); H03K 17/06 (2006.01);
U.S. Cl.
CPC ...
G09G 3/3696 (2013.01); H01L 27/127 (2013.01); H01L 27/1222 (2013.01); H01L 27/1288 (2013.01); H03K 17/063 (2013.01);
Abstract
In at least one operation control TFT (N,P) in a control circuit (), an impurity of a type that generates an impurity level of a channel region () is included in the channel region () as a threshold adjustment impurity, and the concentration of the threshold adjustment impurity is made higher than the concentration of the threshold adjustment impurity in channel regions () of other TFTs () of the same type, thus causing the absolute value of the threshold voltage to be greater than that of the other TFTs () of the same type.