The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Feb. 17, 2014
Landmark Graphics Corporation, Houston, TX (US);
Yin L Cheung, Sugar Land, TX (US);
Michael J Zeitlin, Houston, TX (US);
Mark Acosta, Houston, TX (US);
Landmark Graphics Corporation, Houston, TX (US);
Abstract
System and method for analyzing and imaging three-dimensional volume data sets using a three-dimensional sampling probe. A number of sampling probes can be created, shaped, and moved interactively by the user within the whole three-dimensional volume data set. As the sampling probe changes shape, size, or location in response to user input, the image is re-drawn at a rate sufficiently fast to be perceived as real-time by the user. In this manner, the user can more easily and effectively visualize and interpret the features and physical parameters that are inherent in the three-dimensional volume data set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile