The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Jun. 26, 2012
Mingqing Chen, Iowa City, IA (US);
Yefeng Zheng, Dayton, NJ (US);
Kerstin Mueller, Erlangen, DE;
Christopher Rohkohl, Bochum, DE;
Günter Lauritsch, Nürnberg, DE;
Jan Boese, Eckental, DE;
Gareth Funka-lea, Cranbury, NJ (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
Mingqing Chen, Iowa City, IA (US);
Yefeng Zheng, Dayton, NJ (US);
Kerstin Mueller, Erlangen, DE;
Christopher Rohkohl, Bochum, DE;
Günter Lauritsch, Nürnberg, DE;
Jan Boese, Eckental, DE;
Gareth Funka-Lea, Cranbury, NJ (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
SIEMENS AKTIENGESELLSCHAFT, München, DE;
Abstract
The left ventricle epicardium is estimated in medical diagnostic imaging. C-arm x-ray data is used to detect an endocardium at different phases. The detected endocardium at the different phases is compared to sample endocardiums at different phases. The sample endocardiums have corresponding sample epicardiums. The transformation between the most similar sample endocardium or endocardiums over time and the detected endocardium over time is applied to the corresponding sample epicardium or epicardiums. The transformed sample epicardium over time is the estimated epicardium over time for the C-arm x-ray data.