The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Feb. 11, 2014
General Electric Company, Schenectady, NY (US);
Xiaofeng Liu, Niskayuna, NY (US);
John Frederick Schenck, Voorheesville, NY (US);
Ek Tsoon Tan, Mechanicville, NY (US);
Albert Amos Montillo, Niskayuna, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
The system and method of the invention combines target image intensity into a maximum likelihood estimate (MLE) framework as in STAPLE to take advantage of both intensity-based segmentation and statistical label fusion based on atlas consensus and performance level, abbreviated iSTAPLE. The MLE framework is then solved using a modified expectation-maximization algorithm to simultaneously estimate the intensity profiles of structures of interest as well as the true segmentation and atlas performance level. The iSTAPLE greatly extends the use of atlases such that the target image need not have the same image contrast and intensity range as the atlas images.