The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

May. 17, 2013
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Truong Nguyen, San Diego, CA (US);

Kyoung-Rok Lee, La Jolla, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 5/10 (2006.01); G06T 5/00 (2006.01); G06T 5/20 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 5/10 (2013.01); G06T 5/001 (2013.01); G06T 5/20 (2013.01); G06T 7/0051 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/10028 (2013.01);
Abstract

A preferred method receives a color image and a corresponding raw depth map from a sensor or system. Unreliable regions are determined in the raw depth map by calculating pixel reliabilities for pixels throughout the depth map. Information is collected from the color image, for corresponding pixels in the unreliable regions of the raw depth map, from neighboring pixels outside the unreliable regions. The depth of pixels in the unreliable regions is updated with information collected from the reliable regions. Robust multi-later filtering is conducted on the adjusted depth map to produce an enhanced depth map.


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