The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Aug. 02, 2012
Applicants:

Hiroyuki Higuchi, Kawasaki, JP;

Yu Liu, Kawasaki, JP;

Yuzi Kanazawa, Setagaya, JP;

Inventors:

Hiroyuki Higuchi, Kawasaki, JP;

Yu Liu, Kawasaki, JP;

Yuzi Kanazawa, Setagaya, JP;

Assignee:

FUJITSU LIMITED, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 5/02 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G06F 17/504 (2013.01); G06F 2217/10 (2013.01); G06N 5/02 (2013.01);
Abstract

A disclosed method includes: converting, for each sample point, a set of performance item values for a sample point into coordinate values of a mesh element containing the set among plural mesh elements obtained by dividing a space mapped by the performance items; generating a binary decision graph representing a group of the coordinate values of the sample points; calculating the number of sample points including second sample points that dominates a first sample point and the first sample point, by counting the number of paths in the binary decision graph from a root node to a leaf node representing '1' through at least one of certain nodes corresponding to coordinate values that are equal to or less than coordinate values of the first sample point; and calculating a yield of the first sample point by dividing the calculated number by the number of the plural sample points.


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