The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Dec. 16, 2013
Sap SE, Walldorf, DE;
Unmesh Sreedharan, Walldorf, DE;
Ajay Kumar Gupta, Walldorf, DE;
John MacGregor, Walldorf, DE;
Chandrashekar Vasudevan, Walldorf, DE;
SAP SE, Walldorf, DE;
Abstract
An iterative approach to detect outliers may automatically detect outliers in a data set. The iterative approach may include calculating a mean and an average deviation for a list. The iterative approach may further include calculating the deviations of values of a list if the average deviation is not zero. Any values where the calculated deviation of the point or value is greater than the mean may be selected. The selected points may be set as a second list. The second list may be used by the iterative approach until no points are selected for the second list. The previous list is the set of outliers from the data set.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile