The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Mar. 11, 2013
Applicants:
Long Fei, Mountain View, CA (US);
Ryan Michael Lefever, Mountain View, CA (US);
Robbie Alan Haertel, Mountain View, CA (US);
Inventors:
Long Fei, Mountain View, CA (US);
Ryan Michael Lefever, Mountain View, CA (US);
Robbie Alan Haertel, Mountain View, CA (US);
Assignee:
Google Inc., Mountain View, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30292 (2013.01);
Abstract
A system and method for large-scale data schema analysis and quality assurance is disclosed. A data schema may be received and compiled into an internal representation for analysis. The schema's information may also be exposed via an application programming interface. Using the schema's application programming interface along with a provided requirement, the schema may be analyzed and/or corrected for quality, consistency and interoperability.