The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Oct. 16, 2013
Applicant:

Asolid Technology Co., Ltd., Hsinchu, TW;

Inventor:

Chia-Ching Chu, Taichung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/04 (2006.01); G11C 29/42 (2006.01); G11C 29/44 (2006.01); G06F 11/10 (2006.01); G11C 29/00 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/1048 (2013.01); G11C 29/42 (2013.01); G11C 29/44 (2013.01); G11C 29/822 (2013.01); G11C 16/349 (2013.01); G11C 2029/0411 (2013.01); G11C 2029/4402 (2013.01);
Abstract

A memory controller includes a damaged-column manager, an error checking and correcting decoder (ECC decoder) and a damaged-column decision circuit. The damaged-column manager logs a damaged-column address information in the flash memory. The ECC decoder receives a read data read by the flash memory and generates an error information according to whether or not the read data has error. The damaged-column decision circuit receives the error-column address and counts the number of accumulated generated times corresponding to the error-column address. The damaged-column decision circuit updates the damaged-column address information according to an error information.


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