The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Mar. 14, 2012
Applicants:

Robert Patrick Keeney, Barrington, NH (US);

Bruce Robert Ladeau, Hampton, NH (US);

Rajeswara Rao Pasupuleti, Hyderabad, IN;

Inventors:

Robert Patrick Keeney, Barrington, NH (US);

Bruce Robert Ladeau, Hampton, NH (US);

Rajeswara Rao Pasupuleti, Hyderabad, IN;

Assignee:

Aclara Meters LLC, Hazelwood, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 9/44 (2006.01); G06F 9/46 (2006.01); G06F 13/00 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
G06F 9/455 (2013.01); G06F 2009/45579 (2013.01);
Abstract

A measuring instrument includes at least one processor having at least one processor internal resource. The measuring instrument may also include at least one hardware component external to the processor and at least one storage component. Firmware may be stored in the storage component and is accessible by the processor. The firmware includes at least one application; a virtualized hardware system having routines that emulate at least one processor internal resource; and at least one application programming interface between the application and the virtualized hardware system.


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