The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Jun. 30, 2014
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Robert L. Franch, Wappingers Falls, NY (US);

Eren Kursun, Yorktown Heights, NY (US);

Liang-Teck Pang, White Plains, NY (US);

Phillip J. Restle, Katonah, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/08 (2006.01);
U.S. Cl.
CPC ...
G06F 1/08 (2013.01);
Abstract

A stitchable clock mesh, a dual operation mode method, and a master clock stratum are provided for a 3D chip stack. The stitchable clock mesh includes at least one clock mesh, on each of the two or more strata, having a plurality of sectors for providing a global clock signal. The stitchable clock mesh further includes mesh data sensors, on each of the two or more strata, for collecting mesh data for the at least one mesh. The mesh data includes measured functional data and measured performance data for a current system configuration. The stitchable clock mesh further includes mesh segmentation and joining circuitry for selectively performing a segmentation operation or a joining operation on the least one mesh or one or more portions thereof responsive to the mesh data and the current system configuration selectable from a plurality of system target configurations.


Find Patent Forward Citations

Loading…