The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Mar. 20, 2015
Applicant:

Brother Kogyo Kabushiki Kaisha, Nagoya-shi, Aichi-ken, JP;

Inventors:

Marika Ogiso, Nagoya, JP;

Masashi Imai, Kasugai, JP;

Assignee:

BROTHER KOGYO KABUSHIKI KAISHA, Nagoya-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/08 (2006.01); G03G 21/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/0812 (2013.01); G03G 21/0011 (2013.01); G03G 21/0017 (2013.01); G03G 2215/0805 (2013.01);
Abstract

In a developing device, a developing roller has an outer peripheral surface movable in a moving direction upon rotation of the developing roller to transfer developing agent to a developing region having a width in an axial direction of the developing roller. A thickness regulation blade includes a rubber portion. The rubber portion provides a contact region in contact with the outer peripheral surface to provide a nip region relative to the developing roller. The contact region includes a first region; and a second region. The first region and the second region each extends in the axial direction by a length at least equal to or greater than the width of the developing region. The first region has a first surface roughness. The second region is positioned downstream of the first region in the moving direction and has a second surface roughness finer than the first surface roughness.


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