The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Jun. 10, 2011
Applicants:

Michael Plotkin, Rehovot, IL;

David K. Towner, Boise, ID (US);

Haim Livne, Kfar-Sava, IL;

Mark Schechterman, Nes-Ziona, IL;

Inventors:

Michael Plotkin, Rehovot, IL;

David K. Towner, Boise, ID (US);

Haim Livne, Kfar-Sava, IL;

Mark Schechterman, Nes-Ziona, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 26/08 (2006.01); G02B 26/12 (2006.01); G03G 15/043 (2006.01);
U.S. Cl.
CPC ...
G02B 26/123 (2013.01); G02B 26/124 (2013.01); G02B 26/125 (2013.01); G02B 26/127 (2013.01); G02B 26/128 (2013.01); G03G 15/0435 (2013.01);
Abstract

An optical scanning apparatus, a system and a method of optical scanning independently determine illumination spot size and spacing. The apparatus includes an array of optical emitters to provide a plurality of optical beams and a plurality of microlenses to receive the optical beams. The microlenses form an intermediate image of the array at substantially unity array magnification. The apparatus further includes an adjustable collimator to receive the plurality of optical beams from the intermediate image, a beam scanner to scan the optical beams in an in-scan direction, and a scan lens to focus the scanned optical beams. An arrangement of illumination spots forms an image of the array.


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