The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Aug. 06, 2014
Applicant:

Bp Corporation North America Inc., Houston, TX (US);

Inventors:

Joanne Fredrich, Houston, TX (US);

Nathan Lane, Katy, TX (US);

Julianna Toms, Houston, TX (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G01V 8/00 (2006.01); G01N 33/24 (2006.01); G06T 7/00 (2006.01); G01N 23/04 (2006.01); G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
G01V 8/00 (2013.01); G01N 23/046 (2013.01); G01N 33/24 (2013.01); G06F 17/5018 (2013.01); G06T 7/0079 (2013.01); G06T 7/0081 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20112 (2013.01); G06T 2207/20148 (2013.01); G06T 2207/30132 (2013.01);
Abstract

A testing system for performing image based direct numerical simulation to characterize petrophysical properties of a rock sample under the simulated deformation condition, for example as representative of subsurface conditions. A digital image volume corresponding to x-ray tomographic images of a rock sample is segmented into its significant elastic phases, such as pore space, clay fraction, grain contacts and mineral type, and overlaid with an unstructured finite element mesh. A simulated deformation is applied to the segmented image volume, and the resulting deformed unstructured mesh is numerically analyzed, for example by way of direct numerical simulation, to determine the desired petrophysical properties.


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