The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Sep. 03, 2012
Applicants:
Yihua Bruce Yu, Elicott City, MD (US);
Yue Feng, Cockeysville, MD (US);
Marc Taraban, Gaithersburg, MD (US);
Inventors:
Yihua Bruce Yu, Elicott City, MD (US);
Yue Feng, Cockeysville, MD (US);
Marc Taraban, Gaithersburg, MD (US);
Assignees:
University of Maryland, Baltimore, Baltimore, MD (US);
University of Maryland, College Park, College Park, MD (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 33/50 (2006.01); G01R 33/563 (2006.01);
U.S. Cl.
CPC ...
G01R 33/56358 (2013.01); G01R 33/50 (2013.01);
Abstract
Techniques include determining, non-invasively and without applying deformational stress, a nuclear magnetic resonance relaxation rate at a volume inside a subject. The method also includes determining a mechanical property of material at the volume inside the subject based on the nuclear magnetic resonance relaxation rate.