The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

May. 23, 2013
Applicants:

Minhee Yun, Pittsburgh, PA (US);

David Schwartzman, Pittsburgh, PA (US);

Jiyong Huang, Pittsburgh, PA (US);

Inventors:

Minhee Yun, Pittsburgh, PA (US);

David Schwartzman, Pittsburgh, PA (US);

Jiyong Huang, Pittsburgh, PA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B82Y 40/00 (2011.01); B82Y 15/00 (2011.01); G01N 33/543 (2006.01); G01N 27/414 (2006.01);
U.S. Cl.
CPC ...
G01N 33/54373 (2013.01); G01N 27/4145 (2013.01); G01N 27/4146 (2013.01); G01N 33/54366 (2013.01); B82Y 15/00 (2013.01); Y10S 977/762 (2013.01);
Abstract

A method of fabricating polymer single nanowires, comprising the steps of: spin coating a polymethylmethacrylate resist onto a silicon wafer patterned with at least one gold electrode pair; creating a nanochannel using e-beam lithography between each pair of the at least one gold electrode pairs; placing the silicon wafer into an aniline monomer polymerization solution; reacting the polymerization solution to give a coated wafer and a polyaniline film; and cleaning the coated wafer of polymethylmethacrylate resist and polyaniline film to give at least one gold electrode pair with a connecting polymer single nanowire.


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