The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Dec. 14, 2012
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
C. Brent Harrison, Seattle, WA (US);
Andrew Lister, Bainbridge Island, WA (US);
Valdis Janis Riekstins, Woodinville, WA (US);
Willem Stokdijk, Seattle, WA (US);
Becton, Dickinson and Company, Franklin Lakes, NJ (US);
Abstract
Provided herein are systems and methods for improving yield of sorted particles. In one embodiment, for example, there is provided a system including: (a) a flow cytometer to analyze a sample, wherein the flow cytometer provides a parameter plot based on the analysis of the sample; (b) a user-interface, wherein a user can define a coincidence acceptance gate in the parameter plot, and wherein the coincidence acceptance gate identities a non-target particle population in the sample that may be accepted with a target particle in a subsequent sort analysis; and (c) a sort analysis system to sort particles within the sample, while accepting particles defined by coincidence acceptance gate.