The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Aug. 31, 2009
Applicants:
Maciej Szkulmowski, Torun, PL;
Maciej Wojtkowski, Torun, PL;
Anna Szkulmowska, Torun, PL;
Tomasz Bajraszewski, Glogowo, PL;
Inventors:
Maciej Szkulmowski, Torun, PL;
Maciej Wojtkowski, Torun, PL;
Anna Szkulmowska, Torun, PL;
Tomasz Bajraszewski, Glogowo, PL;
Assignee:
CANON OPHTHALMIC TECHNOLOGIES SP. Z O.O, Wroclaw, PL;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01); G01N 21/47 (2006.01); A61B 5/00 (2006.01); A61B 3/10 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4795 (2013.01); A61B 5/0059 (2013.01); A61B 5/0066 (2013.01); G01B 9/02044 (2013.01); G01B 9/02078 (2013.01); G01B 9/02091 (2013.01); A61B 3/102 (2013.01); A61B 3/1233 (2013.01);
Abstract
The invention relates to a method and apparatus for measuring the spatial and velocity distribution of scattering structures of a sample in semi-transparent matter. The acquired spectral data I(k, t) are transformed in two steps to image data I(z, v). A Doppler shift is imposed on the light to a separate real and mirror images in the v space to suppress the complex ambiguity artifact.