The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 24, 2016

Filed:

Dec. 07, 2010
Applicants:

Masaru Miyai, Kyoto, JP;

Masahiro Nishikawa, Kyoto, JP;

Inventors:

Masaru Miyai, Kyoto, JP;

Masahiro Nishikawa, Kyoto, JP;

Assignee:

HORIBA, LTD., Kyoto, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/00 (2006.01); G01N 21/3504 (2014.01); G01N 21/27 (2006.01);
U.S. Cl.
CPC ...
G01N 21/3504 (2013.01); G01N 21/274 (2013.01); G01N 33/0004 (2013.01); G01N 33/006 (2013.01); G01N 33/0006 (2013.01);
Abstract

A gas analyzing system that can perform calibration without being influenced by the deterioration of span gas in a span gas supply line. An open-close device control part that receives a calibration start signal issuing an instruction to start zero calibration and span calibration, and controls an open-close device for a span gas flow path. An open-close device for a zero gas flow path, wherein if the open-close device control part receives a new calibration start signal after a predetermined time has passed since previous calibration was performed, before the span calibration is started, for a predetermined time, the open-close device control part controls the open-close device for the span gas flow path so as to open the open-close device for the span gas flow path, and thereby purges span gas that remains in the span gas flow path.


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