The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 24, 2016
Filed:
Sep. 30, 2014
Applicant:
Sakura Finetek U.s.a., Inc., Torrance, CA (US);
Inventors:
Hwai-Jyh Michael Yang, Cerritos, CA (US);
Xuan S. Bui, Torrance, CA (US);
Assignee:
Sakura Finetek U.S.A., Inc., Torrance, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B26D 5/00 (2006.01); G01N 1/00 (2006.01); G01N 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 1/06 (2013.01); Y10S 83/9155 (2013.01); Y10T 83/04 (2015.04); Y10T 83/141 (2015.04); Y10T 83/525 (2015.04); Y10T 83/536 (2015.04); Y10T 83/538 (2015.04); Y10T 83/6572 (2015.04);
Abstract
A sample sectioning device includes a cutting mechanism, a sample holder, a drive system, and a surface orientation sensor. The sample holder is operable to hold a sample. The cutting mechanism is operable to cut sections from the sample. The drive system is coupled with the sample holder. The drive system is operable to drive movement between the sample held by the sample holder and the cutting mechanism. The surface orientation sensor is operable to sense an orientation of a surface of the sample held by the sample holder.